DocumentCode :
1304566
Title :
Compact Modeling of Partially Depleted Silicon-on-Insulator Drain-Extended MOSFET (DEMOSFET) Including High-Voltage and Floating-Body Effects
Author :
Agarwal, Tarun K. ; Trivedi, Amit Ranjan ; Subramanian, Venkatachalam ; Kumar, M.J.
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol. Delhi, New Delhi, India
Volume :
58
Issue :
10
fYear :
2011
Firstpage :
3485
Lastpage :
3493
Abstract :
In this paper, a scalable compact model for partially depleted silicon-on-insulator drain-extended MOSFETs (PD SOI DEMOSFETs) is developed using a subcircuit approach. The proposed compact model captures the special direct-current behavior of a PD SOI DEMOSFET transistor. Our model accounts for high-voltage effects such as quasi-saturation and impact ionization in the drift region, along with a floating-body effect such as the kink effect in the output characteristics of the floating-body PD SOI DEMOSFET transistor. In the subcircuit approach used, the channel region is modeled using the BSIM4SOI model, and the drift region is modeled using a bias-dependent resistance model, along with a current-controlled current source. The model is validated for a set of channel and drift lengths to demonstrate the scalability of the model. The accuracy of the proposed compact model is verified using 2-D numerical simulations.
Keywords :
MOSFET; impact ionisation; numerical analysis; semiconductor device models; silicon-on-insulator; compact modeling; current-controlled current source; drift region; floating-body effects; high-voltage effects; impact ionization; kink effect; partially depleted silicon-on-insulator drain-extended MOSFET; quasisaturation; Impact ionization; Integrated circuit modeling; Junctions; Logic gates; Mathematical model; Numerical models; Transistors; Compact model; floating-body effects; high-voltage (HV) devices; impact ionization; kink effect; quasi-saturation; scalability; silicon-on-insulator drain-extended MOSFETs (SOI DEMOSFETs); subcircuit approach;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2011.2162156
Filename :
5995158
Link To Document :
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