DocumentCode :
1304583
Title :
Single-Turn Fault Detection in Induction Machine Using Complex-Wavelet-Based Method
Author :
Seshadrinath, Jeevanand ; Singh, Bawa ; Panigrahi, B.K.
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol. Delhi, New Delhi, India
Volume :
48
Issue :
6
fYear :
2012
Firstpage :
1846
Lastpage :
1854
Abstract :
Interturn short circuit is often confused with voltage imbalance in induction machines. Therefore, detection and classification of single-turn fault (TF) are becoming important in the presence of voltage imbalances, under various loading conditions. Substantial studies are conducted on the interturn fault detection, but a comprehensive method for classifying the faults at different operating points of the machine, under varying supply conditions, is still a challenge. This is a critical problem in industries since the induction motors form the major workhorses. The artificial-intelligence-based techniques are advanced methods in fault monitoring. This, when combined with optimization techniques, is expected to give improved and accurate results with minimum false alarms. In this paper, a technique is developed, based on recent developments in the wavelet-based analysis, particularly in the complex wavelet domain. The support vector machines are adopted for comparing the classification accuracy obtained using complex-wavelet- and standard discrete-wavelet-based methods. The receiver operating characteristic curves indicate that the fault detection, down to single turn, is feasible using a single current sensor.
Keywords :
artificial intelligence; asynchronous machines; fault diagnosis; optimisation; short-circuit currents; wavelet transforms; artificial-intelligence-based techniques; complex-wavelet-based method; induction machine; interturn fault detection; interturn short circuit; loading conditions; optimization techniques; single current sensor; single-turn fault detection; standard discrete-wavelet-based methods; voltage imbalances; wavelet-based analysis; Circuit faults; Discrete wavelet transforms; Filter banks; Support vector machines; Wavelet analysis; Complex wavelets; fault detection; feature extraction; induction machines; supply imbalance; support vector machine (SVM);
fLanguage :
English
Journal_Title :
Industry Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-9994
Type :
jour
DOI :
10.1109/TIA.2012.2222012
Filename :
6319384
Link To Document :
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