DocumentCode :
13046
Title :
Improved Variable EWMA Controller for General ARIMA Processes
Author :
Ming-Da Ma ; Jia-Yi Li
Author_Institution :
Center for Control Theor. & Guidance Technol., Harbin Inst. of Technol., Harbin, China
Volume :
28
Issue :
2
fYear :
2015
fDate :
May-15
Firstpage :
129
Lastpage :
136
Abstract :
The exponentially weighted moving average (EWMA) controller is a popular run-to-run control scheme in semiconductor manufacturing because of its effectiveness and simplicity. In this paper, we propose an improved variable EWMA controller design method. The optimal discount factor of the EWMA controller is determined by minimizing the mean square error of process output at each run. The proposed method overcomes some potential problems of Tseng´s method and can be applied to general autoregressive integrated moving average processes. A numerical study is performed to investigate the performance and sensitivity of the proposed method. It is shown that the proposed method is more effective and robust than the conventional EWMA controller when the process parameters are estimated with uncertainty.
Keywords :
autoregressive moving average processes; mean square error methods; semiconductor device manufacture; ARIMA process; Tseng method; exponentially weighted moving average; general autoregressive integrated moving average processes; mean square error; run-to-run control scheme; semiconductor manufacturing; variable EWMA controller; Control systems; Fabrication; Mean square error methods; Process control; Sensitivity; Stability analysis; EWMA; Run-to-run (RtR) control; Run-to-run control; exponentially weighted moving average (EWMA); semiconductor manufacturing; variable discount factor;
fLanguage :
English
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
0894-6507
Type :
jour
DOI :
10.1109/TSM.2015.2419453
Filename :
7078888
Link To Document :
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