DocumentCode
1304965
Title
Parameter estimation in strongly nonlinear circuits
Author
Van Den Eijnde, Eli ; Schoukens, Johan
Author_Institution
Vrije Univ., Brussels, Belgium
Volume
39
Issue
6
fYear
1990
fDate
12/1/1990 12:00:00 AM
Firstpage
853
Lastpage
859
Abstract
The combination of the generalized Volterra approach to compute the steady-state output of strongly nonlinear systems with the maximum likelihood estimator (MLE) developed by J. Schoukens et al. (see ibid., vol.IM-37, p.10-17, 1988) yields a powerful tool to estimate the parameters in strongly nonlinear circuits. As a result, it is possible to determine system characteristics that cannot be measured directly or are difficult to obtain. The latter is illustrated by means of an inverting amplifier built around an operational amplifier causing slew-induced distortion. Two different models are used to represent the operational amplifier. The first considers only one nonlinearity, namely a saturating current source characterized by two parameters, but can only describe symmetric slew-induced distortion. The other model uses two diodes and results in a six-parameter model capable of addressing the asymmetric case. By comparing the results obtained for these approaches with measurements on the actual circuit, the capability of the identification technique for strongly nonlinear systems is demonstrated
Keywords
electric distortion; estimation theory; linearisation techniques; nonlinear network analysis; operational amplifiers; parameter estimation; Volterra; asymmetric distortion; diodes; identification; inverting amplifier; maximum likelihood estimator; operational amplifier; parameter estimation; saturating current source; six-parameter model; slew-induced distortion; steady state analysis; steady-state output; strongly nonlinear circuits; symmetric distortion; Distortion measurement; Maximum likelihood estimation; Nonlinear circuits; Nonlinear distortion; Nonlinear systems; Operational amplifiers; Parameter estimation; Power system modeling; Steady-state; Yield estimation;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.65782
Filename
65782
Link To Document