• DocumentCode
    1304965
  • Title

    Parameter estimation in strongly nonlinear circuits

  • Author

    Van Den Eijnde, Eli ; Schoukens, Johan

  • Author_Institution
    Vrije Univ., Brussels, Belgium
  • Volume
    39
  • Issue
    6
  • fYear
    1990
  • fDate
    12/1/1990 12:00:00 AM
  • Firstpage
    853
  • Lastpage
    859
  • Abstract
    The combination of the generalized Volterra approach to compute the steady-state output of strongly nonlinear systems with the maximum likelihood estimator (MLE) developed by J. Schoukens et al. (see ibid., vol.IM-37, p.10-17, 1988) yields a powerful tool to estimate the parameters in strongly nonlinear circuits. As a result, it is possible to determine system characteristics that cannot be measured directly or are difficult to obtain. The latter is illustrated by means of an inverting amplifier built around an operational amplifier causing slew-induced distortion. Two different models are used to represent the operational amplifier. The first considers only one nonlinearity, namely a saturating current source characterized by two parameters, but can only describe symmetric slew-induced distortion. The other model uses two diodes and results in a six-parameter model capable of addressing the asymmetric case. By comparing the results obtained for these approaches with measurements on the actual circuit, the capability of the identification technique for strongly nonlinear systems is demonstrated
  • Keywords
    electric distortion; estimation theory; linearisation techniques; nonlinear network analysis; operational amplifiers; parameter estimation; Volterra; asymmetric distortion; diodes; identification; inverting amplifier; maximum likelihood estimator; operational amplifier; parameter estimation; saturating current source; six-parameter model; slew-induced distortion; steady state analysis; steady-state output; strongly nonlinear circuits; symmetric distortion; Distortion measurement; Maximum likelihood estimation; Nonlinear circuits; Nonlinear distortion; Nonlinear systems; Operational amplifiers; Parameter estimation; Power system modeling; Steady-state; Yield estimation;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.65782
  • Filename
    65782