• DocumentCode
    1304991
  • Title

    Modeling the wiring of deep submicron ICs

  • Author

    Walker, Martin G.

  • Author_Institution
    Frequency Technol. Inc., Santa Clara, CA, USA
  • Volume
    37
  • Issue
    3
  • fYear
    2000
  • fDate
    3/1/2000 12:00:00 AM
  • Firstpage
    65
  • Lastpage
    71
  • Abstract
    The semiconductor industry has fuelled the enormous growth of the electronics industry with an unending flow of even better, faster, cheaper chips. These chip improvements, in turn, have been stoked by steady progress in semiconductor process technology, which, as Moore´s law predicts, doubles IC transistor counts every 18 months. Supporting this progress is the infrastructure provided by design tools, which today, however, comes up short against the process advances crucial to tomorrow´s chips. Why? Because present design tools and methodologies presuppose that chip performance is determined by the transistor. That supposition may have been true a few years ago, but no more. Chip performance now depends on the interconnect. The new significance of interconnect performance is driving changes throughout the logic design flow because logic synthesis engines and other tools assume that timing can be predicted before the physical layout is done. But pre-layout and post-layout timing values no longer converge, and design tools must evolve to match this change in process technology. The first step is for vendors to create tools that accurately predict the performance of designs in this interconnect-dominated technology. The author discusses the importance of timing, 2D and 3D modelling of the interconnects, and deep submicron effects
  • Keywords
    integrated circuit interconnections; integrated circuit modelling; logic design; timing; chip performance; deep submicron IC; interconnect; interconnect performance; logic design; logic synthesis engines; post-layout timing values; pre-layout timing values; timing; wiring modeling; Assembly; Capacitance; Conductors; Impedance; Libraries; Shape; Time series analysis; Timing; Wiring;
  • fLanguage
    English
  • Journal_Title
    Spectrum, IEEE
  • Publisher
    ieee
  • ISSN
    0018-9235
  • Type

    jour

  • DOI
    10.1109/6.825662
  • Filename
    825662