DocumentCode :
1305030
Title :
A framework for design and testing of analog integrated circuits
Author :
Soenen, Eric G. ; VanPeteghem, Peter M. ; Liu, Hu-Chen ; Narayan, Sriram ; Cummings, James T.
Author_Institution :
Texas A&M Univ., College Station, TX, USA
Volume :
39
Issue :
6
fYear :
1990
fDate :
12/1/1990 12:00:00 AM
Firstpage :
890
Lastpage :
893
Abstract :
A global methodology for analog and mixed analog-to-digital VLSI design requires close interaction between simulations, CAD tools, measurements, and testing. An integrated hardware and software environment (framework) that implements this methodology in a systematic way is described. As an example of its application, the modeling of errors in multistage analog-to-digital converters (ADCs) is described. The framework has a unique software organization designed to facilitate the interpretation of measurement results and the feedback of information to the design world. The perfectly modular nature of the software makes it easy to gain a fundamental understanding of error mechanisms. In the ADC example, this understanding eliminates the need to probe internal parts of a circuit since information on internal errors can be recovered from external measurements
Keywords :
VLSI; analogue-digital conversion; application specific integrated circuits; circuit CAD; linear integrated circuits; A/D convertor; CAD; analog integrated circuits; design; integrated hardware and software environment; mixed analog-to-digital VLSI design; modeling of errors; modular software; multistage analog-to-digital converters; simulations; testing; Analog integrated circuits; Application software; Circuit simulation; Circuit testing; Computer errors; Design automation; Hardware; Integrated circuit measurements; Integrated circuit testing; Very large scale integration;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.65791
Filename :
65791
Link To Document :
بازگشت