DocumentCode
1305039
Title
The use of model-based test requirements throughout the product life cycle
Author
Bukata, E. ; Davis, Danny C. ; Shombert, L.
Author_Institution
AverStar Inc., Vienna, VA, USA
Volume
15
Issue
2
fYear
2000
fDate
2/1/2000 12:00:00 AM
Firstpage
39
Lastpage
44
Abstract
Test requirements, which are generally collected in multiple disparate formats throughout the life cycle of an electronic product, could be used in various applications that reduce test and development cycle times and increase the confidence in the final test program. Unfortunately, test requirements are seldom captured in a consistent format that may be processed by a computer, thus eliminating the possibility of using such requirements in an engineering application. Additionally, such an approach disallows test requirements captured in one segment of the product life cycle to be reused in subsequent life cycle stages. This paper describes a model-based methodology, specifically the Test Requirements Model (TeRM), which can be shown to facilitate the transfer of test-related product information between various stages of the life cycle. This transportability, in conjunction with an exchange format that can be processed by a computer, permits test requirement information to support value-added applications in the engineering process throughout the life cycle of a product
Keywords
automatic test equipment; automatic test software; concurrent engineering; life cycle costing; product development; program verification; resource allocation; exchange format; model-based test requirements; product development; product life cycle; test program verification; test requirements model; test resource allocation; test-related product information; transportability; value-added applications; Application software; Costs; Job shop scheduling; Large Hadron Collider; Life testing; Modeling; Robustness; Springs; Systems engineering and theory; USA Councils;
fLanguage
English
Journal_Title
Aerospace and Electronic Systems Magazine, IEEE
Publisher
ieee
ISSN
0885-8985
Type
jour
DOI
10.1109/62.825670
Filename
825670
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