Title :
Microwave monolithic integrated circuit-related metrology at the National Institute of Standards and Technology
Author :
Reeve, Gerome ; Marks, Roger ; Blackburn, David
Author_Institution :
Nat. Inst. of Standards & Technol., Boulder, CO, USA
fDate :
12/1/1990 12:00:00 AM
Abstract :
How the National Institute of Standards and Technology (NIST) interacts with the GaAs community and the Defense Advanced Research Projects Agency (DARPA) microwave monolithic integrated circuit (MIMIC) initiative is described. The organization of a joint industry and government laboratory consortium for MIMIC-related metrology research is described along with some of the initial technical developments at NIST done in support of the consortium
Keywords :
III-V semiconductors; MMIC; electric noise measurement; gallium arsenide; measurement standards; microwave measurement; DARPA; Defense Advanced Research Projects Agency; GaAs; NIST; National Institute of Standards and Technology; S-parameter measurement; metrology; microstrip line; microwave measurement; microwave monolithic integrated circuit; noise figure measurement; wafer level probe; Circuits; Force measurement; Gallium arsenide; Metrology; Microwave devices; Millimeter wave measurements; NIST; Particle measurements; Scattering parameters; Standards development;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
