Title :
An algorithm of diagnostics with signature analyzer
Author :
Chan, John C. ; Womack, Baxter F.
Author_Institution :
IBM Corp., Austin, TX, USA
fDate :
12/1/1990 12:00:00 AM
Abstract :
The study of faulty signature (checksum) in computer hardware testing is presented. When a faulty signature is observed, it is caused by one of many possible input sequences that contain errors at different locations. The faulty signature is analyzed in order to reduce the number of tests and simplify the fault-isolation process. It is found that the number of errors among the sequences is distributed with binomial characteristics. To support the analysis, a computer simulation is performed to analyze the distributions of undetected errors
Keywords :
automatic testing; computer equipment testing; computerised signal processing; digital simulation; error analysis; fault location; logic testing; binomial characteristics; checksum; computer hardware testing; computer simulation; computerised signal processing; diagnostics; distributions of undetected errors; fault-isolation; faulty signature; logic testing; signature analyzer; Algorithm design and analysis; Circuit faults; Circuit testing; Computer errors; Decoding; Fault diagnosis; Hardware; Linear feedback shift registers; Performance analysis; Polynomials;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
