DocumentCode :
1305251
Title :
Incorporating Nonlinear Relationships in Microarray Missing Value Imputation
Author :
Yu, Tianwei ; Peng, Hesen ; Sun, Wei
Author_Institution :
Dept. of Biostat. & Bioinf., Emory Univ., Atlanta, GA, USA
Volume :
8
Issue :
3
fYear :
2011
Firstpage :
723
Lastpage :
731
Abstract :
Microarray gene expression data often contain missing values. Accurate estimation of the missing values is important for downstream data analyses that require complete data. Nonlinear relationships between gene expression levels have not been well-utilized in missing value imputation. We propose an imputation scheme based on nonlinear dependencies between genes. By simulations based on real microarray data, we show that incorporating nonlinear relationships could improve the accuracy of missing value imputation, both in terms of normalized root-mean-squared error and in terms of the preservation of the list of significant genes in statistical testing. In addition, we studied the impact of artificial dependencies introduced by data normalization on the simulation results. Our results suggest that methods relying on global correlation structures may yield overly optimistic simulation results when the data have been subjected to row (gene)-wise mean removal.
Keywords :
bioinformatics; genetics; mean square error methods; molecular biophysics; data normalization; global correlation structures; microarray gene expression; missing value imputation; nonlinear relationships; normalized root-mean-squared error; statistical testing; Accuracy; Arrays; Bioinformatics; Computational biology; Correlation; Gene expression; Kernel; gene expression; missing value.; statistical analysis; Animals; Cell Line, Tumor; Computational Biology; Computer Simulation; Databases, Genetic; Gene Expression Profiling; Humans; Lymphoma, B-Cell; Models, Statistical; Nonlinear Dynamics; Oligonucleotide Array Sequence Analysis; Salmon; Yeasts;
fLanguage :
English
Journal_Title :
Computational Biology and Bioinformatics, IEEE/ACM Transactions on
Publisher :
ieee
ISSN :
1545-5963
Type :
jour
DOI :
10.1109/TCBB.2010.73
Filename :
5557847
Link To Document :
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