Title :
A 2T1C Embedded DRAM Macro With No Boosted Supplies Featuring a 7T SRAM Based Repair and a Cell Storage Monitor
Author :
Chun, Ki Chul ; Zhang, Wei ; Jain, Pulkit ; Kim, Chris H.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Minnesota, Minneapolis, MN, USA
Abstract :
A truly logic-compatible gain cell eDRAM macro with no boosted supplies is presented. A 2T1C gain cell implemented only with regular thin oxide devices consists of an asymmetric 2T cell and a coupling PMOS capacitor. The PMOS capacitor ensures proper operation even without a boosted supply by utilizing a beneficial coupling for read and a preferential boosting for write. A repair scheme based on a single-ended 7T SRAM has features such as a local differential write and shared control with the main 2T1C array. A storage voltage monitor is proposed to track the retention characteristics of a gain cell eDRAM under PVT variations and to adjust its refresh rate adaptively. A 128 kb eDRAM test chip implemented in a 65 nm Low-Power (LP) process operates at a random access frequency of 714 MHz with a static power dissipation of 161.8 μW per Mb for a 500 μs refresh rate at 1.1 V and 85°C.
Keywords :
DRAM chips; SRAM chips; embedded systems; 2T1C array; PVT variation; SRAM based repair; asymmetric 2T cell; cell storage monitor; coupling PMOS capacitor; embedded DRAM macro; frequency 714 MHz; logic-compatible gain cell eDRAM macro; memory size 128 KByte; power 161.8 muW; single-ended 7T SRAM; size 65 mm; storage voltage monitor; temperature 85 C; thin oxide device; voltage 1.1 V; Arrays; Maintenance engineering; Monitoring; Random access memory; Temperature measurement; Temperature sensors; Voltage measurement; 2T; 2T1C gain cell; 7T SRAM; cache; embedded memory; logic-compatible eDRAM; repair scheme; retention time; storage monitor; temperature sensor;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2012.2206685