• DocumentCode
    1305520
  • Title

    Fundamental limits of Bayesian inference: order parameters and phase transitions for road tracking

  • Author

    Yuille, Alan L. ; Coughlan, James M.

  • Author_Institution
    Smith-Kettlewell Eye Res. Inst., San Francisco, CA, USA
  • Volume
    22
  • Issue
    2
  • fYear
    2000
  • fDate
    2/1/2000 12:00:00 AM
  • Firstpage
    160
  • Lastpage
    173
  • Abstract
    There is a growing interest in formulating vision problems in terms of Bayesian inference and, in particular, the maximum a posteriori (MAP) estimator. In this paper, we consider the special case of detecting roads from aerial images and demonstrate that analysis of this ensemble enables us to determine fundamental bounds on the performance of the MAP estimate. We demonstrate that there is a phase transition at a critical value of the order parameter; below this phase transition, it is impossible to detect the road by any algorithm. We derive closely related order parameters which determine the time and memory complexity of search and the accuracy of the solution using the n* search strategy. Our approach can be applied to other vision problems, and we briefly summarize the results when the model uses the “wrong prior”. We comment on how our work relates to studies of the complexity of visual search and the critical behaviour in the computational cost of solving NP-complete problems
  • Keywords
    belief networks; computational complexity; computer vision; edge detection; optical tracking; road traffic; search problems; traffic engineering computing; Bayesian inference; MAP estimator; NP-complete problems; computational complexity; computer vision; curve tracking; maximum a posteriori; order parameters; phase transitions; road tracking; search problem; Algorithm design and analysis; Bayesian methods; Convergence; Image analysis; Inference algorithms; Information filtering; Performance analysis; Phase estimation; Probability distribution; Roads;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.825754
  • Filename
    825754