Title :
Study of temperature rise of metallized capacitors applied in repetitive pulse
Author :
Kong, Zhonghua ; Dai, Ling ; Lin, Fuchang ; Li, Hua ; Jang, Yadong
Author_Institution :
State Key Lab. of Electonic Thin Film & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
fDate :
8/1/2009 12:00:00 AM
Abstract :
When metallized capacitors are applied to pulsed power applications with frequency less than 1 Hz, heat induced by current can be ignored. However, it is necessary to consider the accumulation effect of heat on temperature rise of capacitors which are applied to repetitive pulsed systems. The paper mainly study the influence of frequency and line current density on temperature rise of metallized capacitors applied to repetitive pulsed systems. The experiment results show that temperature increases with line current density and frequency increasing, and when surface temperature of capacitor is higher than 110degC, the melted PP film would blow out from the middle location of capacitors, and the highest temperature in the capacitor is calculated. The capacitor segment location and line current density on the single discharge energy of the capacitor are influenced and has been analyzed by ATP. Temperature rise of each segment location of capacitor caused by single discharge was calculated, the results show that temperature rise is very small.
Keywords :
current density; discharges (electric); power capacitors; pulsed power technology; ATP analysis; accumulation effect; melted PP film; metallized capacitor; repetitive pulsed power system; single discharge energy; temperature rise current density; Breakdown voltage; Capacitors; Current density; Dielectrics; Fault location; Filters; Frequency; Metallization; Temperature distribution; Thermal stresses; Metallized capacitor, repetitive pulse, temperature rise, ATP.;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TDEI.2009.5211861