• DocumentCode
    130577
  • Title

    Phase retrieval methods for optical imaging and metrology

  • Author

    Pedrini, G. ; Faridian, A. ; Gao, Peng ; Naik, Dinesh ; Singh, Ashutosh ; Osten, W. ; Takeda, Masanori

  • Author_Institution
    Inst. fur Tech. Opt., Univ. Stuttgart, Stuttgart, Germany
  • fYear
    2014
  • fDate
    7-11 July 2014
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Phase retrieval methods have useful applications for optical imaging and metrology. We will see how holographic techniques may be used for increasing the resolution of microscopic images, measurement of residual stresses, imaging of occluded objects, imaging using incoherent illumination; furthermore, phase retrieval methods, which do not use a reference wave, are described.
  • Keywords
    holography; image reconstruction; image resolution; image retrieval; internal stresses; holographic techniques; incoherent illumination imaging; metrology; microscopic image resolution; occluded object imaging; optical imaging; phase retrieval methods; reference wave; residual stress measurement; Holography; Image reconstruction; Lenses; Lighting; Microscopy; Optical imaging; Optimized production technology; holography; image reconstruction; phase retrieval;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Optics (WIO), 2014 13th Workshop on
  • Conference_Location
    Neuchatel
  • Type

    conf

  • DOI
    10.1109/WIO.2014.6933285
  • Filename
    6933285
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=130577