DocumentCode :
130577
Title :
Phase retrieval methods for optical imaging and metrology
Author :
Pedrini, G. ; Faridian, A. ; Gao, Peng ; Naik, Dinesh ; Singh, Ashutosh ; Osten, W. ; Takeda, Masanori
Author_Institution :
Inst. fur Tech. Opt., Univ. Stuttgart, Stuttgart, Germany
fYear :
2014
fDate :
7-11 July 2014
Firstpage :
1
Lastpage :
3
Abstract :
Phase retrieval methods have useful applications for optical imaging and metrology. We will see how holographic techniques may be used for increasing the resolution of microscopic images, measurement of residual stresses, imaging of occluded objects, imaging using incoherent illumination; furthermore, phase retrieval methods, which do not use a reference wave, are described.
Keywords :
holography; image reconstruction; image resolution; image retrieval; internal stresses; holographic techniques; incoherent illumination imaging; metrology; microscopic image resolution; occluded object imaging; optical imaging; phase retrieval methods; reference wave; residual stress measurement; Holography; Image reconstruction; Lenses; Lighting; Microscopy; Optical imaging; Optimized production technology; holography; image reconstruction; phase retrieval;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Optics (WIO), 2014 13th Workshop on
Conference_Location :
Neuchatel
Type :
conf
DOI :
10.1109/WIO.2014.6933285
Filename :
6933285
Link To Document :
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