DocumentCode :
1305773
Title :
Novel method of estimation flicker frequency noise in lasers
Author :
Ishida, Osamu
Author_Institution :
NTT Transmisions Syst. Lab., Kanagawa, Japan
Volume :
2
Issue :
11
fYear :
1990
Firstpage :
784
Lastpage :
786
Abstract :
A simple method is proposed for the precise measurement of flicker (1/f) frequency noise in lasers. The method is based on measurement of the Allan variance of beat signals produced by delayed self-heterodyning. A simple relation between measured variance and frequency-noise spectrum is derived analytically. Measurement on a 1.5- mu m semiconductor laser diode is presented. It is pointed out that since the method possesses the great advantage of insensitivity to optical power fluctuations, it can be widely used for precisely testing laser frequency quality.<>
Keywords :
demodulation; electron device noise; frequency measurement; laser variables measurement; semiconductor junction lasers; 1.5 micron; Allan variance; beat signals; delayed self-heterodyning; flicker frequency noise; frequency-noise spectrum; laser frequency quality testing; laser noise measurement; measured variance; semiconductor laser diode; 1f noise; Analysis of variance; Delay; Diode lasers; Frequency estimation; Frequency measurement; Laser noise; Noise measurement; Semiconductor device noise; Semiconductor lasers;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/68.63220
Filename :
63220
Link To Document :
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