Title :
A 30 Gb/s/Link 2.2 Tb/s/mm
Inductively-Coupled Injection-Locking CDR for High-Speed DRAM Interface
Author :
Take, Yasuhiro ; Miura, Noriyuki ; Kuroda, Tadahiro
Author_Institution :
Dept. of Electron. & Electr. Eng., Keio Univ., Yokohama, Japan
Abstract :
This paper presents a 30 Gb/s/link 2.2 Tb/s/mm2 inductive-coupling link for a high-speed DRAM interface. The data rate per layout area is the highest among DRAM interfaces reported up to now. The proposed interface employs a high-speed injection-locking CDR technique that utilizes the derivative property of inductive coupling. Compared to conventional injection-locking CDR based on an XOR edge detector, the proposed technique doubles the operation speed and increases the data rate to 30 Gb/s/link. As a result, the data rate per layout area is increased to 2.2 Tb/s/mm2 , which is 2X that of the state-of-the-art inductive-coupling link, and 22X that of the state-of-the-art wired link.
Keywords :
DRAM chips; clock and data recovery circuits; DRAM interface; XOR edge detector; bit rate 30 Gbit/s; clock and data recovery circuits; data rate per layout area; inductive coupling; injection-locking CDR; Coils; Image edge detection; Layout; Random access memory; Receivers; Synchronization; Voltage-controlled oscillators; DRAM; Inductive coupling; clock data recovery (CDR); injection-locking; three-dimensional; wireless interconnect;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2011.2164023