DocumentCode :
1306037
Title :
The measurement of the small-signal characteristics of transistors
Author :
Cooke-Yarborough, E.H. ; Florida, C.D. ; Stephen, J.H.
Volume :
1954
Issue :
9
fYear :
1954
fDate :
9/1/1954 12:00:00 AM
Firstpage :
245
Keywords :
characteristics measurement; transistors;
fLanguage :
English
Journal_Title :
Electrical Engineers, Journal of the Institution of
Publisher :
iet
Type :
jour
DOI :
10.1049/jiee-2.1954.0108
Filename :
5323701
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1306037