• DocumentCode
    1306048
  • Title

    Resonant-tunneling diode and HEMT logic circuits with multiple thresholds and multilevel output

  • Author

    Waho, Takao ; Chen, Kevin J. ; Yamamoto, Masafumi

  • Author_Institution
    NTT Syst. Electron. Labs., Kanagawa, Japan
  • Volume
    33
  • Issue
    2
  • fYear
    1998
  • fDate
    2/1/1998 12:00:00 AM
  • Firstpage
    268
  • Lastpage
    274
  • Abstract
    By using resonant-tunneling diodes (RTDs) and high electron mobility transistors (HEMTs), we implement a new class of logic circuits that operate with multiple thresholds and multilevel output. The basic idea of the circuits is to synthesize transfer characteristics by key logic elements, namely, up and down literals. We first describe two fundamental logic circuits based on this idea: a ternary inverter and a literal gate. Then we present experimental results on these circuits fabricated by integrating InP-based RTDs and HEMTs. It is found that these circuits operate successfully with threshold voltages and output levels that have been predicted from individual device characteristics. Consequently, the validity of the basic idea behind the circuits presented here is proven. The device counts and the number of logic stages required for the present circuits are less than half those for conventional ones. A possible application is finally discussed
  • Keywords
    HEMT integrated circuits; field effect logic circuits; logic gates; multivalued logic circuits; negative resistance devices; resonant tunnelling diodes; ternary logic; HEMT logic circuits; InP; device characteristics; device counts; literal gate; logic stages; multilevel output; multiple thresholds; resonant-tunneling diode logic circuits; ternary inverter; transfer characteristics; Circuit synthesis; Diodes; HEMTs; Inverters; Laboratories; Logic circuits; Logic devices; MODFET circuits; RLC circuits; Resonant tunneling devices;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.658629
  • Filename
    658629