• DocumentCode
    1306158
  • Title

    Novel fast multiline analysis of parasitic effects in CPW inductors for MMICs

  • Author

    Huynen, I.

  • Author_Institution
    Univ. Catholique de Louvain, Belgium
  • Volume
    8
  • Issue
    2
  • fYear
    1998
  • fDate
    2/1/1998 12:00:00 AM
  • Firstpage
    72
  • Lastpage
    74
  • Abstract
    The author presents a novel multiline modeling of monolithic microwave integrated circuit (MMIC) spiral inductors in coplanar waveguide (CPW) technology. Starting from transmission line parameters calculated for only single lines and pairs of lines, a distributed equivalent circuit is established for each section of multicoupled lines in the structure. It readily yields the S-parameters of the section. An adequate interconnection of sections having different topologies results in the S-matrix of the device. Our technique is wideband, fast, and fully scalable. It predicts on-line the effect of the underpass and of spurious propagation along the coplanar waveguide (CPW) grounding. It is shown that a significant frequency shift is due to the combination of those two effects. Results are validated by measurements on SOI inductors, up to the second self-resonance frequency
  • Keywords
    MMIC; S-matrix theory; S-parameters; coplanar waveguides; equivalent circuits; inductors; silicon-on-insulator; transmission line theory; CPW grounding; CPW inductors; MMIC spiral inductors; S-matrix; S-parameters; SOI inductors; coplanar waveguide; distributed equivalent circuit; fast multiline analysis; frequency shift; monolithic microwave integrated circuit; parasitic effects; spurious propagation; transmission line parameters; underpass; Coplanar waveguides; Frequency; Inductors; Integrated circuit modeling; Integrated circuit technology; MMICs; Microwave integrated circuits; Microwave technology; Monolithic integrated circuits; Spirals;
  • fLanguage
    English
  • Journal_Title
    Microwave and Guided Wave Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1051-8207
  • Type

    jour

  • DOI
    10.1109/75.658645
  • Filename
    658645