DocumentCode :
1306197
Title :
Revisiting characteristic impedance and its definition of microstrip line with a self-calibrated 3-D MoM scheme
Author :
Zhu, Lei ; Wu, Ke
Author_Institution :
Dept. de Genie Electr., Ecole Polytech. de Montreal, Que., Canada
Volume :
8
Issue :
2
fYear :
1998
fDate :
2/1/1998 12:00:00 AM
Firstpage :
87
Lastpage :
89
Abstract :
Characteristic impedance and its definition are revisited and discussed for microstrip line with a self-calibrated three-dimensional (3-D) method of moments (MoM). This 3-D MoM accommodates a scheme called short-open calibration (SOC) so that potential parasitic effects brought by the impressed voltage excitation and other relevant factors can be effectively removed. In this way, the characteristic impedance can be accurately defined through a relationship between equivalent voltage and current on the two sides of a microstrip line having a finite length. Simulated results are compared with the Jansen´s two-dimensional (2-D) and Rautio´s 3-D definition
Keywords :
calibration; electric impedance; method of moments; microstrip lines; transmission line theory; characteristic impedance; equivalent current; equivalent voltage; impressed voltage excitation; microstrip line; parasitic effects; self-calibrated 3D MoM scheme; short-open calibration; Calibration; Circuit testing; Dielectric constant; Feeds; Frequency; Helium; Impedance; Microstrip; Moment methods; Voltage;
fLanguage :
English
Journal_Title :
Microwave and Guided Wave Letters, IEEE
Publisher :
ieee
ISSN :
1051-8207
Type :
jour
DOI :
10.1109/75.658650
Filename :
658650
Link To Document :
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