• DocumentCode
    1306197
  • Title

    Revisiting characteristic impedance and its definition of microstrip line with a self-calibrated 3-D MoM scheme

  • Author

    Zhu, Lei ; Wu, Ke

  • Author_Institution
    Dept. de Genie Electr., Ecole Polytech. de Montreal, Que., Canada
  • Volume
    8
  • Issue
    2
  • fYear
    1998
  • fDate
    2/1/1998 12:00:00 AM
  • Firstpage
    87
  • Lastpage
    89
  • Abstract
    Characteristic impedance and its definition are revisited and discussed for microstrip line with a self-calibrated three-dimensional (3-D) method of moments (MoM). This 3-D MoM accommodates a scheme called short-open calibration (SOC) so that potential parasitic effects brought by the impressed voltage excitation and other relevant factors can be effectively removed. In this way, the characteristic impedance can be accurately defined through a relationship between equivalent voltage and current on the two sides of a microstrip line having a finite length. Simulated results are compared with the Jansen´s two-dimensional (2-D) and Rautio´s 3-D definition
  • Keywords
    calibration; electric impedance; method of moments; microstrip lines; transmission line theory; characteristic impedance; equivalent current; equivalent voltage; impressed voltage excitation; microstrip line; parasitic effects; self-calibrated 3D MoM scheme; short-open calibration; Calibration; Circuit testing; Dielectric constant; Feeds; Frequency; Helium; Impedance; Microstrip; Moment methods; Voltage;
  • fLanguage
    English
  • Journal_Title
    Microwave and Guided Wave Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1051-8207
  • Type

    jour

  • DOI
    10.1109/75.658650
  • Filename
    658650