Title :
Manufacturing-based simulation: An overview
Author :
Director, Stephen W.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie-Mellon Univ., Pittsburgh, PA, USA
Abstract :
Integrated circuit designers have become increasingly interested in predicting the quality, in terms of yield as well as performance, of a design prior to manufacture. Toward this end, manufacturing-based methods have evolved. This paper reviews this class of techniques and their applications.
Journal_Title :
Circuits and Devices Magazine, IEEE
DOI :
10.1109/MCD.1987.6323152
