DocumentCode :
1306781
Title :
Some properties of thin-film SOI MOSFETs
Author :
Colinge, Jean-Pierre
Author_Institution :
Hewlett-Packard Labs., Palo Alto, CA, USA
Volume :
3
Issue :
6
fYear :
1987
Firstpage :
16
Lastpage :
20
Abstract :
This paper describes the properties that can be expected from thin-film SOI-MOS transistors. Simple qualitative modeling shows that improvements of different parameters, such as subthreshold slope, hot-electron effects, and short-channel effects, can be obtained when thin, fully depleted films are used.
fLanguage :
English
Journal_Title :
Circuits and Devices Magazine, IEEE
Publisher :
ieee
ISSN :
8755-3996
Type :
jour
DOI :
10.1109/MCD.1987.6323175
Filename :
6323175
Link To Document :
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