• DocumentCode
    1307180
  • Title

    A Shoot-Through Protection Scheme for Converters Built With SiC JFETs

  • Author

    Lai, Rixin ; Wang, Fei ; Burgos, Rolando ; Boroyevich, Dushan ; Zhang, Di ; Ning, Puqi

  • Author_Institution
    Gen. Electr. Global Res. Center, Niskayuna, NY, USA
  • Volume
    46
  • Issue
    6
  • fYear
    2010
  • Firstpage
    2495
  • Lastpage
    2500
  • Abstract
    The SiC JFET is an attractive semiconductor device due to its superior switching performance and high-temperature operating capability. Its shoot-through protection remains a challenge due to the limited practical knowledge existent on this device and due to its inherent normally on nature. Addressing this limitation, this paper presents a novel shoot-through protection scheme in which a bidirectional switch, compounded by a Si insulated-gate bipolar transistor (IGBT) and a relay,is embedded into the dc-link midpoint in order to detect and clear shoot-through faults, taking advantage of the well-known desaturation protection schemes of IGBTs to protect SiC JFETs. This paper describes in detail the proposed protection mechanism and its circuit design, presenting as well the experimental results that verified the effectiveness of the proposed scheme using, first, Si MOSFETs and second, a 10-kW ac-ac converter system using SiC JFETs.
  • Keywords
    AC-AC power convertors; MOS integrated circuits; field effect transistor switches; integrated circuit design; power semiconductor switches; power system protection; switching convertors; AC-AC converter system; IGBT; JFET; MOSFET; SiC; bidirectional switch; circuit design; desaturation protection scheme; insulated-gate bipolar transistor; power 10 kW; power semiconductor device; relay; shoot-through fault; shoot-through protection scheme; Capacitors; Circuit faults; Converters; Insulated gate bipolar transistors; JFETs; Logic gates; Silicon carbide; SiC JFETs; shoot-through protection;
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/TIA.2010.2070785
  • Filename
    5559418