• DocumentCode
    1307278
  • Title

    Proposal of low-noise amplifier utilizing resonant tunneling transistors

  • Author

    Ando, Yuji ; Cappy, Alain

  • Author_Institution
    Kansai Electron. Res. Labs., NEC Corp., Otsu, Japan
  • Volume
    45
  • Issue
    1
  • fYear
    1998
  • fDate
    1/1/1998 12:00:00 AM
  • Firstpage
    31
  • Lastpage
    35
  • Abstract
    A low-noise amplifier utilizing the negative input resistance of resonant tunneling transistors (RTT´s) is proposed. Expected features of the RTT amplifiers are: 1) negligible effect of noise sources at the output, owing to their large power gain; 2) flat variation of noise figure (NF) versus frequency, due to white spectra of noise sources at the input; and 3) a high maximum oscillation frequency (fmax) (over several 100 GHz), Based on simulated DC characteristics, over 500 GHz fmax and 0.3 dB NF at 100 GHz are predicted for optimized AlGaAs/GaAs/AlGaAs resonant tunneling diodes (RTD´s). In an RTT formed by coupling an FET to an optimized RTD, 0.55 dB minimum noise figure and 26 dB associated gain are predicted at 100 GHz. Also, a 1/w2 spectrum of the input noise resistance is predicted at low frequencies
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; millimetre wave amplifiers; millimetre wave circuits; negative resistance; power amplifiers; resonant tunnelling transistors; semiconductor device noise; white noise; 0.3 dB; 0.55 dB; 100 GHz; 26 dB; AlGaAs-GaAs-AlGaAs; input noise resistance; maximum oscillation frequency; microwave low-noise amplifier; negative input resistance; noise figure; output noise sources; power gain; resonant tunneling transistors; simulated DC characteristics; white spectra; Frequency; Gallium arsenide; High power amplifiers; Low-noise amplifiers; Noise figure; Noise measurement; Predictive models; Proposals; Resonant tunneling devices; White noise;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.658808
  • Filename
    658808