Title :
Integrated-circuit digital logic families IIIߞECL and MOS devices
Author :
Garrett, Lane S.
Author_Institution :
Motorola Semiconductor Products Inc.
Abstract :
This final installment of a three-part article is devoted to emitter-coupled logic (ECL) devices as well as to metal oxide semiconductor (MOS) logic devices of the p-channel (P-MOS) and complementary (CMOS) types. The concluding portion presents a summary chart comparing the major parameters of the various IC digital families discussed in the three installments, plus a useful check list of available functions.
Keywords :
Circuit noise; Diodes; Impedance; Logic design; Logic devices; MOS devices; Noise level; Resistors; Semiconductor device noise; Voltage;
Journal_Title :
Spectrum, IEEE
DOI :
10.1109/MSPEC.1970.5213083