Title :
Vertical integration of an In0.15Ga0.85As modulation-doped field effect transistor and GaAs laser grown by molecular beam epitaxy
Author :
Tasker, P.J. ; Schaff, W.J. ; Kapitan, L. ; Shealy, J.R. ; Eastman, L.F.
fDate :
3/15/1990 12:00:00 AM
Abstract :
A vertically integrated structure consisting of an In0.15Ga0.85As pseudomorphic modulation doped field effect transistor (MODFET) and a GaAs graded index separate confinement heterostructure single quantum well (GRINSCH SQW) laser was grown by molecular beam epitaxy. Wafers containing integrated MODFET/laser layers produced MODFETs with DC and microwave performance comparable to wafers containing only MODFET layers, indicating that the modulation doping and the strained In0.15Ga0.85As channel were largely unaffected by the long, high temperature laser growth. The lasers had threshold currents similar to identical structures grown on n-type substrates and the integrated structures had a -3dB modulation bandwidth of 3.5 GHz.
Keywords :
III-V semiconductors; field effect integrated circuits; gallium arsenide; gradient index optics; high electron mobility transistors; indium compounds; integrated optoelectronics; molecular beam epitaxial growth; semiconductor junction lasers; 3.5 GHz; AlGaAs-GaAs; AlGaAs-GaAs-InGaAs-GaAs; DC performance; GRINSCH SQW laser; GaAs laser; GaAs substrate; In 0.15Ga 0.85As pseudomorphic modulation doped field effect transistor; MODFET/laser layers; OEIC; graded index; high temperature laser growth; integrated optoelectronics; microwave performance; modulation bandwidth; molecular beam epitaxy; n-type substrates; semiconductor lasers; separate confinement heterostructure; single quantum well; threshold currents; vertically integrated structure; wafers;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19900228