Title :
Damage from proton irradiation of vertical-cavity surface-emitting lasers
Author :
Paxton, Alan H. ; Carson, Richard F. ; Schöne, Harald ; Taylor, Edward W. ; Choquette, Kent D. ; Hou, Hong Q. ; Lear, Kevin L. ; Warren, Mial E.
Author_Institution :
Phillips Lab., Kirtland AFB, NM, USA
fDate :
12/1/1997 12:00:00 AM
Abstract :
Damage resulting from irradiating oxide-confined vertical-cavity surface-emitting lasers became significant (threshold shift ≈20%, peak power degradation ≈20%) at fluence levels approaching 1×10 13 protons/cm2. The threshold current shifted to higher values, and the peak light output power decreased. Forward-current annealing led to partial recovery of the performance of two of the three lasers for which annealing was attempted. Recent results on proton-implanted devices are summarized in a table
Keywords :
annealing; laser reliability; proton effects; semiconductor lasers; surface emitting lasers; fluence levels; forward-current annealing; oxide-confined vertical-cavity surface-emitting lasers; peak light output power; peak power degradation; proton irradiation; threshold shift; Annealing; Apertures; Gallium arsenide; Laboratories; Laser modes; Optical surface waves; Protons; Quantum well lasers; Surface emitting lasers; Vertical cavity surface emitting lasers;
Journal_Title :
Nuclear Science, IEEE Transactions on
