An attempt to define conservative conditions for total dose evaluation of bipolar ICs

Author

Bonora, L. ; David, J.P.

Author_Institution

ONERA-CERT, Toulouse, France

Volume

44

Issue

6

fYear

1997

fDate

12/1/1997 12:00:00 AM

Firstpage

1974

Lastpage

1980

Abstract

This paper investigates the influence of parameters such as temperature, dose rate and bias upon the degradation of irradiated bipolar commercial ICs (LM124 operational amplifiers and LM139 comparators). Results at 0.003 rad(Si)/s are included and compared with high dose rate irradiations at elevated temperature or combining an elevated temperature and a reverse bias applied to the supply pins of the device. The damage levels reached appear reasonably close to the data at very low dose rate for the tested devices. These preliminary results may contribute to the development of a hardness assurance test method

Keywords

bipolar analogue integrated circuits; comparators (circuits); integrated circuit testing; operational amplifiers; radiation hardening (electronics); LM124 operational amplifier; LM139 comparator; bipolar IC; damage level; degradation; dose rate; elevated temperature; hardness assurance test; irradiation; reverse bias; total dose testing; Annealing; Degradation; Instruments; Lead; Operational amplifiers; Plastic packaging; System testing; Temperature; Virtual reality; Voltage;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.658972

Filename

658972