Title :
A proposed hardness assurance test methodology for bipolar linear circuits and devices in a space ionizing radiation environment
Author :
Pease, Ronald L. ; Cohn, Lewis M. ; Fleetwood, Daniel M. ; Gehlhausen, Mark A. ; Turflinger, Tom L. ; Brown, Dennis B. ; Johnston, Allan H.
Author_Institution :
RLP Res., Albuquerque, NM, USA
fDate :
12/1/1997 12:00:00 AM
Abstract :
A hardness assurance test approach has been developed for bipolar linear circuits and devices in space. It consists of an initial test for dose rate sensitivity and a characterization test method to develop the conditions for a lot acceptance test at high dose rate. For parts with adequate design margin and/or well behaved parts a generic elevated temperature irradiation test is proposed
Keywords :
bipolar analogue integrated circuits; integrated circuit testing; radiation hardening (electronics); space vehicle electronics; bipolar linear circuit; dose rate sensitivity; elevated temperature irradiation test; hardness assurance test; lot acceptance test; space ionizing radiation environment; CMOS technology; Circuit testing; Costs; Degradation; Ionizing radiation; Linear circuits; Manufacturing; Performance evaluation; Space technology; System testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
