• DocumentCode
    130803
  • Title

    Analyzing the significance of process metrics for TT&C software defect prediction

  • Author

    Ye Xia ; Guoying Yan ; Huiying Zhang

  • Author_Institution
    Beijing Inst. of Tracking & Telecommun. Technol., Beijing, China
  • fYear
    2014
  • fDate
    27-29 June 2014
  • Firstpage
    77
  • Lastpage
    81
  • Abstract
    In the existing studies on software prediction, the most proposed methods are usually assessed over the public datasets like NASA metrics data repository, which include a combination of code metrics merely. Obviously, the process metric is also one of the key factors that affect the defect-proneness of software modules. In this paper, life-cycle based management process metrics set and history change process metrics set have been proposed based on the characteristics of development process. In order to analyze the importance of these different metrics for predicting defects in aerospace tracking telemetry and control (TT&C) software, an improved PSO optimized support vector machine algorithm (PSO-SVM) has been presented and took into application. The experiment results over the actual TT&C projects suggest that the prediction performance can be significance improved if the 2 kinds of process metrics are included in the model.
  • Keywords
    aerospace computing; particle swarm optimisation; software metrics; support vector machines; telemetry; NASA metrics data repository; PSO optimized support vector machine algorithm; PSO-SVM; aerospace TT&C software defect prediction; aerospace tracking telemetry and control software; code metrics; history change process metrics set; life-cycle based management process metrics set; software module defect-proneness; Error analysis; History; Predictive models; Process control; Software; Software metrics; TT&C software; defect prediction; process metrics; software metrics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering and Service Science (ICSESS), 2014 5th IEEE International Conference on
  • Conference_Location
    Beijing
  • ISSN
    2327-0586
  • Print_ISBN
    978-1-4799-3278-8
  • Type

    conf

  • DOI
    10.1109/ICSESS.2014.6933517
  • Filename
    6933517