Title :
Analysis of antireflection coatings on angled facet semiconductor laser amplifiers
Author :
Farries, M.C. ; Buus, J. ; Robbins, D.J.
Author_Institution :
Plessey Res. Caswell Ltd., Towcester, UK
fDate :
3/15/1990 12:00:00 AM
Abstract :
An analysis of the modal reflectivity of antireflection coated semiconductor laser amplifiers is presented. The effect of an angle between the facet normal and the amplifier axis is shown to lead to less stringent tolerances on coating index and thickness, and reflectivities of less than 10-4 can be achieved with a 7 degrees facet angle for TE and TM modes simultaneously.
Keywords :
antireflection coatings; laser cavity resonators; reflectivity; semiconductor junction lasers; TE mode; TM modes; angled facet; antireflection coatings; cavity resonators; coating index tolerance; coating thickness tolerance; modal reflectivity; semiconductor laser amplifiers;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19900248
