Title :
Determination of low energy (<160 keV) X-ray spectra and verification of transport calculations through silicon
Author :
Turinetti, J.R. ; Critchfield, K.L. ; Chavez, J.R. ; Kemp, W.T. ; Bellem, R.D. ; Beutle, D.E.
Author_Institution :
Phillips Lab., Kirtland AFB, NM, USA
fDate :
12/1/1997 12:00:00 AM
Abstract :
X-ray spectroscopy discrepancies at measured energies below 50 keV are shown through ITS detector response calculations to be caused by germanium K edge escape peak losses. Accounting for this detector response, CEPXS/ONELD transport calculations through silicon agree well with measurements
Keywords :
X-ray detection; X-ray spectra; X-ray spectrometers; elemental semiconductors; germanium radiation detectors; silicon; 50 to 160 keV; CEPXS/ONELD transport code; Ge; ITS detector response; Si; X-ray spectroscopy; germanium K edge escape peak loss; low energy X-ray spectra; silicon; Collimators; Energy measurement; Energy resolution; Germanium; Laboratories; Loss measurement; Silicon; Spectroscopy; X-ray detection; X-ray detectors;
Journal_Title :
Nuclear Science, IEEE Transactions on
