Title :
A 5.5-mW
9.4-dBm IIP3 1.8-dB NF CMOS LNA Employing Multiple Gated Transistors With Capacitance Desensitization
Author :
Jin, Tae Hwan ; Kim, Tae Wook
Author_Institution :
Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea
Abstract :
A capacitance desensitization technique is proposed for a multiple gated transistors amplifier with source degeneration to relax second-order distortion contribution to a third-order intermodulation distortion (IMD3), as well as an induced-gate noise contribution to noise figure. An extra capacitance, which is added between gate and source nodes of input transistors in a parallel manner, can desensitize the contribution of second-order harmonic feedback to IMD3. The capacitance is useful for optimizing noise figure, as well by controlling the input matching network quality factor (Q), which can desensitize the induced-gate noise contribution to noise figure. The low-noise amplifier is implemented with the proposed technique using 1P6M 0.18-μm CMOS technology for 900-MHz code division multiple access (CDMA) receivers. It shows a third-order intercept point of +9.4 dBm and noise figure of 1.8 dB while consuming 5.5 mW at 1.5 V.
Keywords :
CMOS analogue integrated circuits; integrated circuit design; intermodulation distortion; low noise amplifiers; CMOS low noise amplifier; CMOS technology; capacitance desensitization; code division multiple access receivers; frequency 900 MHz; gate nodes; induced-gate noise contribution; input matching network quality factor; multiple gated transistors amplifier; noise figure; noise figure 1.8 dB; power 5.5 mW; second-order distortion contribution; second-order harmonic feedback; size 0.18 mum; source degeneration; source nodes; third-order intermodulation distortion; voltage 1.5 V; Capacitance; Impedance matching; Linearity; Logic gates; Noise; Transconductance; Transistors; Harmonic feedback; linearity; low-noise amplifier (LNA); multiple gated transistors (MGTRs); third-order intercept point (IIP3);
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2010.2063790