Title :
Simultaneous Two-Parameter Sensing Using a Single Tilted Moiré Fiber Bragg Grating With Discrete Wavelet Transform Technique
Author :
Wong, Allan C L ; Giovinazzo, Marco ; Tam, Hwa-Yaw ; Lu, Chao ; Peng, Gang-Ding
Author_Institution :
Dept. of Electron. & Inf. Eng., Hong Kong Polytech. Univ., Kowloon, China
Abstract :
We propose and demonstrate using a single tilted moiré fiber Bragg grating (TMFBG) with the discrete wavelet transform (DWT) technique for simultaneous measurement of refractive index (RI) and temperature. The particular feature of interest is that the spectrum consists of two separate parts associated with the phase-shifted main Bragg mode and discrete cladding modes, and that they have distinctive responses to RI and temperature. Our results showed that the cladding modes are, while the Bragg mode is not, sensitive to the surrounding RI. On the other hand, both the Bragg and cladding modes have the same linear temperature response. Hence, temperature can be obtained from the Bragg mode shift, and RI from the differential shift between the Bragg and cladding modes. In our experiment, the measured shifts of the Bragg and cladding modes can be unambiguously determined by applying the DWT technique. Thus, simultaneous two-parameter sensing using only a single TMFBG sensor is realized.
Keywords :
Bragg gratings; discrete wavelet transforms; fibre optic sensors; optical fibre cladding; refractive index; refractive index measurement; temperature measurement; temperature sensors; discrete cladding modes; discrete wavelet transform; linear temperature response; phase-shifted main Bragg mode; refractive index; simultaneous two-parameter sensing; single TMFBG sensor; single tilted moire fiber Bragg grating; Discrete wavelet transforms; Fiber gratings; Optical fiber sensors; Temperature measurement; Temperature sensors; Wavelength measurement; Fiber grating sensor; refractive index (RI); simultaneous two-parameter sensing; temperature; tilted moiré fiber Bragg grating (TMFBG);
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2010.2072955