Title :
Terahertz Near-Field Microscope: Analysis and Measurements of Scattering Signals
Author :
Moon, Kiwon ; Jung, Euna ; Lim, Meehyun ; Do, Youngwoong ; Han, Haewook
Author_Institution :
Dept. of Electr. Eng., POSTECH, Pohang, South Korea
Abstract :
We present the analysis and measurements of scattering signals of a terahertz pulse scattering-type near-field microscope. We used a self-consistent line dipole image method for the quantitative analysis of the THz near-field interaction. The line scan across a gold film demonstrated that the terahertz microscope has a nanoscale resolution of ~80 nm. The measurements of scattering signals on gold and silicon substrates were in good agreement with calculations.
Keywords :
electromagnetic wave scattering; gold; near-field scanning optical microscopy; silicon; terahertz wave imaging; Au; Si; quantitative analysis; scattering signals; self consistent line dipole image method; terahertz near field microscope; terahertz pulse scattering; Gold; Microscopy; Optical imaging; Optical scattering; Probes; Substrates; Terahertz time-domain spectroscopy; terahertz scanning near-field microscope; terahertz wave;
Journal_Title :
Terahertz Science and Technology, IEEE Transactions on
DOI :
10.1109/TTHZ.2011.2159876
