Title :
Risk assessment for heavy ions of parts tested with protons
Author :
Neill, P. M O´ ; Badhwa, G.D. ; Culpepper, W.X.
Author_Institution :
NASA Johnson Space Center, Houston, TX, USA
fDate :
12/1/1997 12:00:00 AM
Abstract :
An internuclear cascade-evaporation code is used to model energy deposition in thin slabs of silicon. This model shows that protons produce a significant number of events with effective Linear Energy Transfer (LET) greater than 8 MeV cm2/mg and demonstrates that proton testing of microelectronic components can be an effective way to screen devices for low Earth orbit susceptibility to heavy ions
Keywords :
elemental semiconductors; failure analysis; integrated circuit testing; proton effects; silicon; space vehicle electronics; SEU; effective linear energy transfer; energy deposition; heavy ions; internuclear cascade evaporation code; low Earth orbit susceptibility; microelectronic components; protons; risk assessment; space-based applications; Aerospace electronics; Energy exchange; Ionization; Particle beams; Protons; Risk management; Silicon; Slabs; Space stations; System testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
