• DocumentCode
    1310490
  • Title

    Fast Estimation of Line-Start Reluctance Machine Parameters by Finite Element Analysis

  • Author

    Boroujeni, Samad Taghipour ; Bianchi, Nicola ; Alberti, Luigi

  • Author_Institution
    Dept. of Eng., Shahrekord Univ., Sharekord, Iran
  • Volume
    26
  • Issue
    1
  • fYear
    2011
  • fDate
    3/1/2011 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    This paper compares two methods to compute the parameters of a line-start synchronous reluctance (LSSR) machine, by means of finite element analysis. In both methods, both the impact of the skin effect on the rotor parameters and the impact of saturation on magnetizing inductances are taken into account. The first method is based on an equivalent single-phase model of the machine. A pulsating flux is imposed along the d- and q-axes separately, so as to compute the machine parameters along both d- and q-axes. Magnetizing inductances are achieved as a function of the flux, and the rotor resistances and leakage inductances are obtained as a function of rotor frequency. The second method is based on the d-q axis model of the LSSR machine. A rotating magnetic field is imposed, and the d-q axis parameters are estimated simultaneously from the field solution. In addition, such a method allows the cross-saturation to be considered as well.
  • Keywords
    finite element analysis; inductance; magnetic fields; reluctance machines; rotors; d-axis; estimation; finite element analysis; leakage inductances; line-start reluctance machine parameters; magnetic field; magnetizing inductances; pulsating flux; q-axis; rotor frequency; rotor parameters; rotor resistances; Computational modeling; Integrated circuit modeling; Iron; Magnetic separation; Rotors; Saturation magnetization; Windings; Equivalent circuit; finite element (FE) simulation; line-start; parameter estimation; synchronous reluctance machine;
  • fLanguage
    English
  • Journal_Title
    Energy Conversion, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8969
  • Type

    jour

  • DOI
    10.1109/TEC.2010.2061851
  • Filename
    5560783