• DocumentCode
    1310531
  • Title

    Diffraction from a truncated grounded dielectric slab: a comparative full-wave/physical-optics analysis

  • Author

    Maci, Stefano ; Borselli, Leonardo ; Cucurachi, Andrea

  • Author_Institution
    Dept. of Inf. Eng., Siena Univ., Italy
  • Volume
    48
  • Issue
    1
  • fYear
    2000
  • fDate
    1/1/2000 12:00:00 AM
  • Firstpage
    48
  • Lastpage
    57
  • Abstract
    The problem of diffraction at the edge of a semi-infinite grounded dielectric slab excited by a line source is investigated. This canonical problem may be used as a reference solution in the high-frequency regime for patch antennas radiating from a finite grounded slab. Both physical optics (PO) and integral equation (IE) approaches are used and compared. The PO formulation is cast in a convenient asymptotic form that neatly describes the diffraction processes associated with the various wave species. The IE, solved by the method of moments, is formulated by enforcing the continuity of the electric field on an infinite aperture orthogonal to the slab. This allows a drastic reduction of unknowns, provided that appropriate entire domain basis functions are used that are shaped to match the asymptotic behavior of the aperture field. Comparison between the PO and IE solutions is presented to determine the range of validity of PO
  • Keywords
    antenna theory; electromagnetic wave diffraction; integral equations; method of moments; microstrip antennas; physical optics; aperture field; asymptotic behavior; asymptotic form; diffraction; edge; entire domain basis functions; full-wave analysis; high-frequency regime; integral equation; method of moments; patch antennas; physical-optics analysis; truncated grounded dielectric slab; wave species; Apertures; Dielectric constant; Dielectric substrates; Electromagnetic diffraction; Integral equations; Optical diffraction; Optical surface waves; Patch antennas; Physical optics; Slabs;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/8.827385
  • Filename
    827385