Title :
Measurement of uniformity of driving voltage in Ti:LiNbO/sub 3/ waveguides using Mach-Zehnder interferometers
Author :
Fujiwara, Takumi ; Watanabe, Akio ; Mori, Hiroshi
Author_Institution :
Sumitomo Metal Min. Co., Tokyo, Japan
fDate :
4/1/1990 12:00:00 AM
Abstract :
A method for measuring the spatial variation of electrically induced index change (electrooptical effect) in Ti-diffused LiNbO/sub 3/ optical waveguides is demonstrated. By segmenting the electrodes of Mach-Zehnder modulators, electrically induced index changes at as many as 45 positions on x-cut and z-cut substrates have been measured. The result confirms that the spatial variation of index change is within +or-3%.<>
Keywords :
electro-optical devices; integrated optics; light interferometry; lithium compounds; optical modulation; optical waveguides; refractive index measurement; substrates; titanium; voltage measurement; LiNbO/sub 3/:Ti; Mach-Zehnder interferometers; Mach-Zehnder modulators; Ti:LiNbO/sub 3/ waveguides; driving voltage; electrically induced index change; electrically induced index changes; electrooptical effect; index change spatial variation; modulator electrode segmentation; optical waveguides; voltage uniformity measurement; x-cut substrates; z-cut substrates; Electric variables measurement; Electrodes; Electrooptic effects; Electrooptical waveguides; Interferometers; Optical interferometry; Optical scattering; Optical waveguides; Switches; Voltage;
Journal_Title :
Photonics Technology Letters, IEEE
