Title :
Neutron-induced single event burnout in high voltage electronics
Author :
Normand, Eugene ; Wert, Jerry L. ; Oberg, Dennis L. ; Majewski, Peter P. ; Voss, Peter ; Wender, S.A.
Author_Institution :
Boeing Defence & Space Group, Seattle, WA, USA
fDate :
12/1/1997 12:00:00 AM
Abstract :
Energetic neutrons with an atmospheric neutron spectrum, which were demonstrated to induce single event burnout in power MOSFETs, have been shown to induce burnout in high voltage (>3000 V) electronics when operated at voltages as low as 50% of rated voltage. The laboratory failure rates correlate well with field failure rates measured in Europe
Keywords :
failure analysis; neutron effects; power MOSFET; 3000 V; atmospheric neutron spectrum; failure rate; high voltage electronics; power MOSFET; single event burnout; Attenuation; Concrete; Laboratories; MOSFETs; Neutrons; Nondestructive testing; Protons; Semiconductor diodes; Thyristors; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
