DocumentCode
1310913
Title
Neutron-induced single event burnout in high voltage electronics
Author
Normand, Eugene ; Wert, Jerry L. ; Oberg, Dennis L. ; Majewski, Peter P. ; Voss, Peter ; Wender, S.A.
Author_Institution
Boeing Defence & Space Group, Seattle, WA, USA
Volume
44
Issue
6
fYear
1997
fDate
12/1/1997 12:00:00 AM
Firstpage
2358
Lastpage
2366
Abstract
Energetic neutrons with an atmospheric neutron spectrum, which were demonstrated to induce single event burnout in power MOSFETs, have been shown to induce burnout in high voltage (>3000 V) electronics when operated at voltages as low as 50% of rated voltage. The laboratory failure rates correlate well with field failure rates measured in Europe
Keywords
failure analysis; neutron effects; power MOSFET; 3000 V; atmospheric neutron spectrum; failure rate; high voltage electronics; power MOSFET; single event burnout; Attenuation; Concrete; Laboratories; MOSFETs; Neutrons; Nondestructive testing; Protons; Semiconductor diodes; Thyristors; Voltage;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.659062
Filename
659062
Link To Document