DocumentCode :
1311280
Title :
Dynamic stimulated Brillouin scattering analysis
Author :
Djupsjöbacka, A. ; Jacobsen, G. ; Tromborg, B.
Author_Institution :
Ericsson Telecom AB, Stockholm, Sweden
Volume :
18
Issue :
3
fYear :
2000
fDate :
3/1/2000 12:00:00 AM
Firstpage :
416
Lastpage :
424
Abstract :
We present a new simple analysis-including the effect of spontaneous emission-of the (dynamic) influence of stimulated Brillouin scattering (SBS) on the detected receiver eye diagram. It applies in principle for general types of modulation formats such as the digital formats of amplitude shift keying (ASK), frequency shift keying (FSK), and phase shift keying (PSK). The analysis is formulated for a determination of the signal power depiction and intersymbol interference (ISI) caused by the combined effect of fiber dispersion, fiber attenuation and nonlinear fiber effects such as the effect of self-phase modulation (SPM) and SBS. The analysis allows a quantification of the dithering influence on the SBS threshold. Representative numerical examples are presented for two single-channel ON-OFF modulated 10-Gh/s systems utilizing Franz-Keldysh and Mach-Zehnder-type modulators.
Keywords :
amplitude shift keying; frequency shift keying; optical fibre dispersion; optical modulation; optical receivers; phase shift keying; self-phase modulation; stimulated Brillouin scattering; 10 Gbit/s; ASK; FSK; Franz-Keldysh modulators; Mach-Zehnder-type modulators; PSK; SBS; SBS threshold; amplitude shift keying; detected receiver eye diagram; digital format; dynamic stimulated Brillouin scattering analysis; fiber attenuation; fiber dispersion; frequency shift keying; intersymbol interference; modulation formats; nonlinear fiber effects; phase shift keying; self-phase modulation; signal power depiction; single-channel ON-OFF modulated 10-Gb/s systems; spontaneous emission; Amplitude shift keying; Attenuation; Brillouin scattering; Cause effect analysis; Dispersion; Frequency shift keying; Intersymbol interference; Modulation; Phase shift keying; Signal analysis;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/50.827515
Filename :
827515
Link To Document :
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