DocumentCode :
1311894
Title :
Beam focusing characteristics of silicon microtips with an in-plane lens
Author :
Py, Christophe ; Itoh, Junji ; Hirano, Takayuki ; Kanemaru, Seigo
Author_Institution :
Nat. Res. Council of Canada, Ottawa, Ont., Canada
Volume :
44
Issue :
3
fYear :
1997
fDate :
3/1/1997 12:00:00 AM
Firstpage :
498
Lastpage :
502
Abstract :
Single microtips, 2×2 and 10×10 arrays of microtips surrounded by an integrated focusing ring, were fabricated and their focusing characteristics experimentally investigated. Observation of the beam on a phosphor screen shows that the focusing is very effective for single microtips and 2×2 arrays; moreover, the reduction in emitted current is much smaller than for double-gate focusing. 10×10 arrays of microtips, however, do not generate very focused beams. These results agree well with simulations. The possibility of simultaneous focusing and deflecting is also discussed, and a new structure combining the advantages of double-gate and surrounding ring focusing is suggested
Keywords :
electron beam focusing; electron optics; elemental semiconductors; silicon; vacuum microelectronics; FEDs; Si; beam focusing characteristics; deflecting; electron optics; emitted current; field emission microtips; in-plane lens; integrated focusing ring; surrounding ring focusing; Anodes; Electrodes; Electron emission; Fabrication; Laboratories; Laser excitation; Lenses; Phosphors; Silicon; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.556161
Filename :
556161
Link To Document :
بازگشت