Robust BER estimator for DBPSK modulation

Fast industrial test of RF circuits is today a main challenge issue with current wireless standards. As the impact of the test on the overall product cost is no longer negligible, there is a strong motivation in simplifying the test. With the emergence of low throughput systems like ultra-narrow band ones, this topic becomes even more critical. The industrial test must be performed in few seconds per chip, it allows only few data bits for testing, making the real BER estimation unfeasible. In this paper we present a new way of estimating the BER for DBPSK modulation, which ensure accuracy, fast convergence and robustness against impairments like CFO. We also compare it to several classic BER estimators for the same kind of system, and discuss about the performances.