Title :
Medium–Large Induction Machines
Author :
Arshad, Waqas M. ; Kanerva, Sami ; Bono, Silvia ; Menescardi, Massimo ; Persson, Holger
Author_Institution :
ABB Corp. Res. in Raleigh, Raleigh, NC, USA
Abstract :
In this article, the accuracy levels of different scaling procedures for starting current measurements are addressed through the statistical analysis of locked-rotor tests involving hundreds of medium-large induction machines. This is performed to ascertain the confidence level of the predicted full-voltage starting currents from the reduced-voltage factory measurements, a necessity for motors with a strict tolerance to the starting current level. It is shown that, for traditional scaling methods employing only measurements, this accuracy level is 88-90% for scaling step from 0.6 to 1.0 p.u. voltage. This figure could be raised to 95-97% through a novel method that also uses finite element method (FEM) simulations for each individual test voltage. The differences between FEM and voltage measurements are documented and used for correcting the full-voltage FEM simulation. Further, the use of FEM is shown to help in the understanding of the causes and locations of measured voltage-dependent saturation uncertainties. The region (end-core, overhang, or main core) that contributes the most to saturation uncertainties is shown to be identifiable through origin/parametric dependencies, leading to a better product understanding and more reliable scaling methods in future.
Keywords :
asynchronous machines; electric current measurement; finite element analysis; statistical analysis; voltage measurement; finite element method; full-voltage FEM simulation; full-voltage starting currents; locked-rotor tests; medium-large induction machines; origin-parametric dependencies; reduced-voltage factory measurements; scaling methods; starting current measurements; statistical analysis; voltage-dependent saturation uncertainties; Finite element methods; Induction motors; Measurements; Statistical analysis; Voltage measurement;
Journal_Title :
Industry Applications Magazine, IEEE
DOI :
10.1109/MIAS.2010.938385