• DocumentCode
    1313016
  • Title

    Silica-based sol-gel optical waveguides on silicon

  • Author

    Orignac, X. ; Almeida, R.M.

  • Author_Institution
    Dept. de Engenharia de Mater., Inst. Superior Tecnico, Lisbon, Portugal
  • Volume
    143
  • Issue
    5
  • fYear
    1996
  • fDate
    10/1/1996 12:00:00 AM
  • Firstpage
    287
  • Lastpage
    292
  • Abstract
    Silica-based waveguiding layers readily obtained by the spin-coating appropriate sols on silicon wafers. They easily be doped with rare earth elements, intended applications such as lasers or amplifiers. The authors describe the preparation and characterisation of such films. The film structure was investigated by X-ray photoelectron spectroscopy (XPS), X-ray absorption spectroscopies (NEXAFS and EXAFS) and Fourier transform infrared spectroscopy (FTIR). Their surface area, evaluated by Brunauer-Emmett-Teller (BET) analysis, and their porosity, estimated from refractive index measurements, are reported. Finally, rare earth fluorescence lifetime data are presented and interpreted
  • Keywords
    EXAFS; Fourier transform spectroscopy; X-ray photoelectron spectra; fluorescence; infrared spectroscopy; optical fabrication; optical planar waveguides; refractive index measurement; silicon; silicon compounds; silicon-on-insulator; sol-gel processing; solid lasers; Brunauer-Emmett-Teller analysis; EXAFS; Fourier transform infrared spectroscopy; NEXAFS; SiO2-Si; X-ray absorption spectroscopies; X-ray photoelectron spectroscopy; XPS; laser amplifiers; lasers; porosity; rare earth elements; rare earth fluorescence lifetime data; refractive index measurements; silica-based sol-gel optical waveguides; silica-based waveguiding layers; silicon; silicon wafers; sols; spin-coating;
  • fLanguage
    English
  • Journal_Title
    Optoelectronics, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2433
  • Type

    jour

  • DOI
    10.1049/ip-opt:19960834
  • Filename
    556350