DocumentCode
1313016
Title
Silica-based sol-gel optical waveguides on silicon
Author
Orignac, X. ; Almeida, R.M.
Author_Institution
Dept. de Engenharia de Mater., Inst. Superior Tecnico, Lisbon, Portugal
Volume
143
Issue
5
fYear
1996
fDate
10/1/1996 12:00:00 AM
Firstpage
287
Lastpage
292
Abstract
Silica-based waveguiding layers readily obtained by the spin-coating appropriate sols on silicon wafers. They easily be doped with rare earth elements, intended applications such as lasers or amplifiers. The authors describe the preparation and characterisation of such films. The film structure was investigated by X-ray photoelectron spectroscopy (XPS), X-ray absorption spectroscopies (NEXAFS and EXAFS) and Fourier transform infrared spectroscopy (FTIR). Their surface area, evaluated by Brunauer-Emmett-Teller (BET) analysis, and their porosity, estimated from refractive index measurements, are reported. Finally, rare earth fluorescence lifetime data are presented and interpreted
Keywords
EXAFS; Fourier transform spectroscopy; X-ray photoelectron spectra; fluorescence; infrared spectroscopy; optical fabrication; optical planar waveguides; refractive index measurement; silicon; silicon compounds; silicon-on-insulator; sol-gel processing; solid lasers; Brunauer-Emmett-Teller analysis; EXAFS; Fourier transform infrared spectroscopy; NEXAFS; SiO2-Si; X-ray absorption spectroscopies; X-ray photoelectron spectroscopy; XPS; laser amplifiers; lasers; porosity; rare earth elements; rare earth fluorescence lifetime data; refractive index measurements; silica-based sol-gel optical waveguides; silica-based waveguiding layers; silicon; silicon wafers; sols; spin-coating;
fLanguage
English
Journal_Title
Optoelectronics, IEE Proceedings -
Publisher
iet
ISSN
1350-2433
Type
jour
DOI
10.1049/ip-opt:19960834
Filename
556350
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