DocumentCode :
131305
Title :
Lock-in pixels readout circuit using a high speed lateral electric field modulator with differential charge accumulation for stimulated Raman scattering imager
Author :
Mars, Kamel ; Egawa, Ken ; Lioe De Xing ; Han Sang Man ; Takasawa, Taishi ; Yasutomi, Keita ; Kagawa, Keiichiro ; Hashimoto, Mime ; Kawahito, S.
Author_Institution :
Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan
fYear :
2014
fDate :
22-25 June 2014
Firstpage :
249
Lastpage :
252
Abstract :
In this paper, a lock-in pixel readout circuits using a high speed lateral electric field modulator with differential charge accumulation for a stimulated Raman scattering imager is presented. The stimulated Raman scattering works by detecting the vibrations in chemical bonds between atoms, and the generated Raman signal after stimulated scattering processes is very low compared to offset signal. By using a high-speed lateral electric field modulator with lock-in pixels differential charge accumulation technique using a sample-and hold circuit with a fully differential amplifier, very small effective Raman signal can be extracted from large offset signal and high dynamic range is achieved.
Keywords :
Raman spectra; differential amplifiers; image sensors; modulators; readout electronics; sample and hold circuits; Raman signal; chemical bond; differential amplifier; differential charge accumulation technique; high speed lateral electric field modulator; sample and hold circuit; scattering process; stimulated Raman scattering imager; stimulated lock-in pixel readout circuit; vibration detection; Apertures; Arrays; Clocks; Frequency modulation; Generators; Lenses; Metals;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
New Circuits and Systems Conference (NEWCAS), 2014 IEEE 12th International
Conference_Location :
Trois-Rivieres, QC
Type :
conf
DOI :
10.1109/NEWCAS.2014.6934030
Filename :
6934030
Link To Document :
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