DocumentCode
1313444
Title
Modeling GaN: Powerful but Challenging
Author
Dunleavy, Lawrence ; Baylis, Charles ; Curtice, Walter ; Connick, Rick
Author_Institution
Modelithics, Inc., Tampa, FL, USA
Volume
11
Issue
6
fYear
2010
Firstpage
82
Lastpage
96
Abstract
As GaN technology has developed, first in research laboratories and more recently in multiple commercial device manufacturers, the demand for improved nonlinear models has grown alongside the device process improvements. The need for improved models for GaN is twofold: first, GaN devices have unique nuances in behavior to be addressed; second, there is a desire for improved accuracy to take full advantage of the performance wins to be gained by GaN HEMT performance in the areas of high efficiency and high-power operation.
Keywords
III-V semiconductors; gallium compounds; semiconductor device manufacture; semiconductor device models; wide band gap semiconductors; GaN; GaN HEMT performance; high efficiency; high-power operation; semiconductor devices; Data models; Gallium nitride; HEMTs; Integrated circuit modeling; Load modeling; MODFETs;
fLanguage
English
Journal_Title
Microwave Magazine, IEEE
Publisher
ieee
ISSN
1527-3342
Type
jour
DOI
10.1109/MMM.2010.937735
Filename
5564374
Link To Document