• DocumentCode
    1313444
  • Title

    Modeling GaN: Powerful but Challenging

  • Author

    Dunleavy, Lawrence ; Baylis, Charles ; Curtice, Walter ; Connick, Rick

  • Author_Institution
    Modelithics, Inc., Tampa, FL, USA
  • Volume
    11
  • Issue
    6
  • fYear
    2010
  • Firstpage
    82
  • Lastpage
    96
  • Abstract
    As GaN technology has developed, first in research laboratories and more recently in multiple commercial device manufacturers, the demand for improved nonlinear models has grown alongside the device process improvements. The need for improved models for GaN is twofold: first, GaN devices have unique nuances in behavior to be addressed; second, there is a desire for improved accuracy to take full advantage of the performance wins to be gained by GaN HEMT performance in the areas of high efficiency and high-power operation.
  • Keywords
    III-V semiconductors; gallium compounds; semiconductor device manufacture; semiconductor device models; wide band gap semiconductors; GaN; GaN HEMT performance; high efficiency; high-power operation; semiconductor devices; Data models; Gallium nitride; HEMTs; Integrated circuit modeling; Load modeling; MODFETs;
  • fLanguage
    English
  • Journal_Title
    Microwave Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1527-3342
  • Type

    jour

  • DOI
    10.1109/MMM.2010.937735
  • Filename
    5564374