• DocumentCode
    1313499
  • Title

    Correction factors of the mindlin plate equations with the consideration of electrodes [Correspondence]

  • Author

    Jianke Du ; Guijia Chen ; Wenjun Wang ; Rongxing Wu ; Tingfeng Ma ; Ji Wang

  • Author_Institution
    Piezoelectr. Device Lab., Ningbo Univ., Ningbo, China
  • Volume
    59
  • Issue
    10
  • fYear
    2012
  • fDate
    10/1/2012 12:00:00 AM
  • Firstpage
    2352
  • Lastpage
    2358
  • Abstract
    The Mindlin plate theory plays a vital role in the analysis of high-frequency vibrations of quartz crystal resonators in the thickness-shear mode. The coupled equations with an infinite number of vibration modes have been truncated to retain essential modes with strong couplings for simplified analysis, and correction factors have been introduced to ensure exact solutions at cut-off frequencies as part of the validation procedure. Starting from plates without complications, correction factors have also been modified to include electrodes for their mass effect. Such results have been important for higher-order correction factors to ensure accurate consideration of electrodes in AT-cut quartz crystal plates. The findings in this systematic study of correction factors are readily available for the analytical equations with selected modes with strong couplings, and equally convenient for the implementation of the finite element analysis with the Mindlin plate equations.
  • Keywords
    crystal resonators; electrodes; finite element analysis; AT-cut quartz crystal plates; Mindlin plate equation correction factors; Mindlin plate theory; coupled equations; cut-off frequency; electrodes; finite element analysis; high-frequency vibration analysis; higher-order correction factors; mass effect; quartz crystal resonators; thickness-shear mode; Crystals; Cutoff frequency; Electrodes; Equations; Mathematical model; Resonant frequency; Vibrations;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2012.2461
  • Filename
    6327507