Title :
Modeling and characterization of CP-PLL phase noise in presence of dead zone
Author :
Hangmann, Christian ; Wullner, Ingo ; Hedayat, Christian ; Hilleringmann, Ulrich
Author_Institution :
Sensor Technol. Group, Univ. of Paderborn, Paderborn, Germany
Abstract :
The analysis of non-linear mixed-signal systems like CP-PLLs is challenging because general theory of control systems cannot be applied easily. Therefore, CP-PLLs are designed within simulation platforms describing them on transistor-, behavioral-or linear-level. These models are often unprofitable according to the characterization capability, simulation time and computer resources when considering non-ideal effects. To avoid this, the modular and enhanced event-driven model can be used. Since this model is not applicable to combine phase noise and non-ideal effects, this paper focuses on modeling phase noise within the event-driven representation. Furthermore, an analytical description of the impact of dead zone on phase noise is given to obtain an optimized and robust system design.
Keywords :
mixed analogue-digital integrated circuits; phase locked loops; phase noise; CP-PLL phase noise; behavioral-level; computer resources; dead zone; enhanced event-driven model; event-driven representation; linear-level; nonideal effects; nonlinear mixed-signal system analysis; robust system design; simulation time; transistor-level; Analytical models; Computational modeling; Noise measurement; Phase locked loops; Phase noise; Voltage-controlled oscillators; Dead Zone; Event-Driven Modeling; Phase Noise; Phase-Locked Loop; System Design;
Conference_Titel :
New Circuits and Systems Conference (NEWCAS), 2014 IEEE 12th International
Conference_Location :
Trois-Rivieres, QC
DOI :
10.1109/NEWCAS.2014.6934054