• DocumentCode
    1313746
  • Title

    Influence of Edge Defects, Vacancies, and Potential Fluctuations on Transport Properties of Extremely Scaled Graphene Nanoribbons

  • Author

    Poljak, Mirko ; Song, Emil B. ; Wang, Minsheng ; Suligoj, Tomislav ; Wang, Kang L.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of California at Los Angeles, Los Angeles, CA, USA
  • Volume
    59
  • Issue
    12
  • fYear
    2012
  • Firstpage
    3231
  • Lastpage
    3238
  • Abstract
    Atomistic quantum transport simulations of a large ensemble of devices are employed to investigate the impact of different sources of disorder on the transport properties of extremely scaled (length of 10 nm and width of 1-4 nm) graphene nanoribbons. We report the dependence of the transport gap, on- and off-state conductances, and on-off ratio on edge-defect density, vacancy density, and potential fluctuation amplitude. For the smallest devices and realistic lattice defect densities, the transport gap increases by up to ~300%, and the on-off ratio reaches almost ~106 . We also report a rather high variation of the transport gap and on-off ratio. In contrast, we find that the potential fluctuations have a negligible impact on the transport gap and cause a relatively modest increase of the on-off ratio.
  • Keywords
    CMOS integrated circuits; crystal defects; graphene; nanoribbons; vacancies (crystal); C; CMOS node; atomistic quantum transport simulations; edge-defect density; extremely scaled graphene nanoribbon transport property; lattice defect density; off-state conductances; on-off ratio; potential fluctuation amplitude; size 1 nm to 4 nm; size 10 nm; transport gap dependence; vacancy density; CMOS integrated circuits; Fluctuations; Lattices; Photonic band gap; Scattering; Semiconductor device modeling; Edge defects; graphene nanoribbons (GNRs); nonequilibrium Green´s function (NEGF) simulation; potential fluctuations; transport gap; vacancies;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2012.2217969
  • Filename
    6327651