DocumentCode
1313746
Title
Influence of Edge Defects, Vacancies, and Potential Fluctuations on Transport Properties of Extremely Scaled Graphene Nanoribbons
Author
Poljak, Mirko ; Song, Emil B. ; Wang, Minsheng ; Suligoj, Tomislav ; Wang, Kang L.
Author_Institution
Dept. of Electr. Eng., Univ. of California at Los Angeles, Los Angeles, CA, USA
Volume
59
Issue
12
fYear
2012
Firstpage
3231
Lastpage
3238
Abstract
Atomistic quantum transport simulations of a large ensemble of devices are employed to investigate the impact of different sources of disorder on the transport properties of extremely scaled (length of 10 nm and width of 1-4 nm) graphene nanoribbons. We report the dependence of the transport gap, on- and off-state conductances, and on-off ratio on edge-defect density, vacancy density, and potential fluctuation amplitude. For the smallest devices and realistic lattice defect densities, the transport gap increases by up to ~300%, and the on-off ratio reaches almost ~106 . We also report a rather high variation of the transport gap and on-off ratio. In contrast, we find that the potential fluctuations have a negligible impact on the transport gap and cause a relatively modest increase of the on-off ratio.
Keywords
CMOS integrated circuits; crystal defects; graphene; nanoribbons; vacancies (crystal); C; CMOS node; atomistic quantum transport simulations; edge-defect density; extremely scaled graphene nanoribbon transport property; lattice defect density; off-state conductances; on-off ratio; potential fluctuation amplitude; size 1 nm to 4 nm; size 10 nm; transport gap dependence; vacancy density; CMOS integrated circuits; Fluctuations; Lattices; Photonic band gap; Scattering; Semiconductor device modeling; Edge defects; graphene nanoribbons (GNRs); nonequilibrium Green´s function (NEGF) simulation; potential fluctuations; transport gap; vacancies;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2012.2217969
Filename
6327651
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